G. Lekens

	2007
3		R. Moonen, P. Vanmeerbeek, G. Lekens, Ward De Ceuninck, P. Moens, J. Boutsen: Lifetime modeling of intrinsic gate oxide breakdown at high temperature. Microelectronics Reliability 47(9-11): 1389-1393 (2007)
	2005
2		H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)
	2003
1		Philippe Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, Eric Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003)

Coauthor Index

1	Eric Beyne	[1]
2	J. Boutsen	[3]
3	T. Briolat	[2]
4	Ward De Ceuninck	[1] [3]
5	A. Dehbi	[2]
6	R. Dreesen	[1]
7	R. Humke	[2]
8	P. Letullier	[2]
9	P. Moens	[3]
10	R. Moonen	[3]
11	Y. Ousten (Yves Ousten)	[2]
12	H. A. Post	[2]
13	K. Saarinen	[2]
14	R. Schuhmann	[2]
15	Philippe Soussan	[1]
16	P. Vanmeerbeek	[3]
17	W. Werner	[2]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page