 | 2011 |
| 11 |  | Thomas Rabenalt,
Michael Gössel,
Andreas Leininger:
Masking of X-Values by Use of a Hierarchically Configurable Register.
J. Electronic Testing 27(1): 31-41 (2011) |
| 2009 |
| 10 |  | Thomas Rabenalt,
Michael Gössel,
Andreas Leininger:
Masking of X-values by Use of a Hierarchically Configurable Register.
European Test Symposium 2009: 149-154 |
| 9 |  | Frank-Uwe Faber,
Matthias Beck,
Markus Rudack,
Olivier Barondeau,
Thomas Rabenalt,
Michael Gössel,
Andreas Leininger:
Doubling Test Cell Throughput by On-Loadboard Hardware- Implementation and Experience in a Production Environment.
European Test Symposium 2009: 39-44 |
| 8 |  | Martin Hilscher,
Michael Braun,
Michael Richter,
Andreas Leininger,
Michael Gössel:
X-tolerant Test Data Compaction with Accelerated Shift Registers.
J. Electronic Testing 25(4-5): 247-258 (2009) |
| 2008 |
| 7 |  | Martin Hilscher,
Michael Braun,
Michael Richter,
Andreas Leininger,
Michael Gössel:
Accelerated Shift Registers for X-tolerant Test Data Compaction.
European Test Symposium 2008: 133-139 |
| 2007 |
| 6 |  | Andreas Leininger,
Martin Fischer,
Michael Richter,
Michael Gössel:
Using timing flexibility of automatic test equipment to complement X-tolerant test compression techniques.
ITC 2007: 1-9 |
| 2006 |
| 5 |  | Andreas Leininger:
New diagnosis and test methods with high compaction rates.
University of Potsdam 2006: 1-98 |
| 2005 |
| 4 |  | Andreas Leininger,
Peter Muhmenthaler,
Wu-Tung Cheng,
Nagesh Tamarapalli,
Wu Yang,
Hans Tsai:
Compression mode diagnosis enables high volume monitoring diagnosis flow.
ITC 2005: 10 |
| 3 |  | Ralf Arnold,
Andreas Leininger:
Evaluating ATE-equipment for volume diagnosis.
ITC 2005: 9 |
| 2004 |
| 2 |  | Andreas Leininger,
Michael Gössel,
Peter Muhmenthaler:
Diagnosis of Scan-Chains by Use of a Configurable Signature Register and Error-Correcting Code.
DATE 2004: 1302-1309 |
| 1 |  | Michael Gössel,
Krishnendu Chakrabarty,
Vitalij Ocheretnij,
Andreas Leininger:
A Signature Analysis Technique for the Identification of Failing Vectors with Application to Scan-BIST.
J. Electronic Testing 20(6): 611-622 (2004) |