Martin Leibowitz

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2001

1 Norman Goldblatt, Martin Leibowitz, William Lo: Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission. Microelectronics Reliability 41(9-10): 1507-1512 (2001)

	2001
1		Norman Goldblatt, Martin Leibowitz, William Lo: Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission. Microelectronics Reliability 41(9-10): 1507-1512 (2001)

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