 | 2011 |
| 10 |  | Manuel J. Barragan Asian,
Rafaella Fiorelli,
Gildas Leger,
Adoración Rueda,
José L. Huertas:
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs.
Asian Test Symposium 2011: 359-364 |
| 9 |  | Manuel J. Barragan Asian,
Rafaella Fiorelli,
Gildas Leger,
Adoración Rueda,
José L. Huertas:
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures.
J. Electronic Testing 27(3): 277-288 (2011) |
| 2010 |
| 8 |  | Gildas Leger,
Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
On Chopper Effects in Discrete-Time SigmaDelta Modulators.
IEEE Trans. on Circuits and Systems 57-I(9): 2438-2449 (2010) |
| 2009 |
| 7 |  | Gildas Leger,
Adoración Rueda:
Low-Cost Digital Detection of Parametric Faults in Cascaded SigmaDelta Modulators.
IEEE Trans. on Circuits and Systems 56-I(7): 1326-1338 (2009) |
| 2006 |
| 6 |  | Gildas Leger,
Adoración Rueda:
Experimental Validation of a Fully Digital BISTfor Cascaded Sigma Delta Modulators.
European Test Symposium 2006: 131-136 |
| 2005 |
| 5 |  | Diego Vázquez,
Gloria Huertas,
África Luque,
Manuel J. Barragan Asian,
Gildas Leger,
Adoración Rueda,
José Luis Huertas:
Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST.
J. Electronic Testing 21(3): 221-232 (2005) |
| 2004 |
| 4 |  | Diego Vázquez,
Gildas Leger,
Gloria Huertas,
Adoración Rueda,
José L. Huertas:
A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications.
DATE 2004: 298-305 |
| 3 |  | Gildas Leger,
Adoración Rueda:
A Digital Test for First-Order [Sigma-Delta] Modulators.
DATE 2004: 708-709 |
| 2002 |
| 2 |  | Diego Vázquez,
Gloria Huertas,
Gildas Leger,
Adoración Rueda,
José L. Huertas:
Practical solutions for the application of the oscillation-based-test in analog integrated circuits.
ISCAS (1) 2002: 589-592 |
| 1 |  | Diego Vázquez,
Gloria Huertas,
Gildas Leger,
Adoración Rueda,
José L. Huertas:
Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation.
VTS 2002: 433-438 |