Yuan-Jen Lee

	2008
1		Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao: Write Disturbance Modeling and Testing for MRAM. IEEE Trans. VLSI Syst. 16(3): 277-288 (2008)

Coauthor Index

1	Young-Shying Chen	[1]
2	Chien-Chung Hung	[1]
3	Ming-Jer Kao	[1]
4	Chin-Lung Su	[1]
5	Chih-Wea Tsai	[1]
6	Ding-Yeong Wang	[1]
7	Cheng-Wen Wu	[1]

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