Tai-Yi Lee

	2007
1		Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

Coauthor Index

1	Yi-Chuen Eng	[1]
2	Jyi-Tsong Lin	[1]
3	Kao-Cheng Lin	[1]

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