Jun-Ha Lee

	2000
1		Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim: Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87-

Coauthor Index

1	Hee-Sung Kang	[1]
2	Kwan-Do Kim	[1]
3	Seok-Jin Kim	[1]
4	Young-Wug Kim	[1]
5	Jeong-Taek Kong	[1]
6	Young-Kwan Park	[1]

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