Jon C. Lee

	2009
4		Yasuhiro Mitsui, Takeshi Sunaoshi, Jon C. Lee: A study of electrical characteristic changes in MOSFET by electron beam irradiation. Microelectronics Reliability 49(9-11): 1182-1187 (2009)
	2003
3		Jon C. Lee, J. H. Chuang: A Novel Application of C-AFM: Deep Sub-micron Single Probing for IC Failure Analysis. Microelectronics Reliability 43(9-11): 1687-1692 (2003)
	2002
2		Jon C. Lee, C. H. Chen, David Su, J. H. Chuang: Investigation of Sensitivity Improvement on Passive Voltage Contrast for Defect Isolation. Microelectronics Reliability 42(9-11): 1707-1710 (2002)
	2001
1		Jon C. Lee, David Su, J. H. Chuang: A Novel Application of the FIB Lift-out Technique for 3-D TEM Analysis. Microelectronics Reliability 41(9-10): 1551-1556 (2001)

Coauthor Index

1	C. H. Chen	[2]
2	J. H. Chuang	[1] [2] [3]
3	Yasuhiro Mitsui	[4]
4	David Su	[1] [2]
5	Takeshi Sunaoshi	[4]

Colors in the list of coauthors

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