Jih-Nung Lee

	2009
3		Hsiang-Huang Wu, Jih-Nung Lee, Ming-Cheng Chiang, Po-Wei Liu, Chi-Feng Wu: A comprehensive TCAM test scheme: An optimized test algorithm considering physical layout and combining scan test with at-speed BIST design. ITC 2009: 1-10
	2003
2		Kuo-Liang Cheng, Chih-Wea Wang, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu: FAME: A Fault-Pattern Based Memory Failure Analysis Framework. ICCAD 2003: 595-598
1		Chih-Wea Wang, Kuo-Liang Cheng, Jih-Nung Lee, Yung-Fa Chou, Chih-Tsun Huang, Cheng-Wen Wu, Frank Huang, Hong-Tzer Yang: Fault Pattern Oriented Defect Diagnosis for Memories. ITC 2003: 29-38

Coauthor Index

1	Kuo-Liang Cheng	[1] [2]
2	Ming-Cheng Chiang	[3]
3	Yung-Fa Chou	[1] [2]
4	Chih-Tsun Huang	[1] [2]
5	Frank Huang	[1]
6	Po-Wei Liu	[3]
7	Chih-Wea Wang	[1] [2]
8	Cheng-Wen Wu	[1] [2]
9	Chi-Feng Wu	[3]
10	Hsiang-Huang Wu	[3]
11	Hong-Tzer Yang	[1]

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