Dae Young Lee

	2011
2		Dae Young Lee, David D. Wentzloff, John P. Hayes: Wireless wafer-level testing of integrated circuits via capacitively-coupled channels. DDECS 2011: 99-104
	2009
1		Erik Jan Marinissen, Dae Young Lee, John P. Hayes, Chris Sellathamby, Brian Moore, Steven Slupsky, Laurence Pujol: Contactless testing: Possibility or pipe-dream? DATE 2009: 676-681

Coauthor Index

1	John P. Hayes	[1] [2]
2	Erik Jan Marinissen	[1]
3	Brian Moore	[1]
4	Laurence Pujol	[1]
5	Chris Sellathamby	[1]
6	Steven Slupsky	[1]
7	David D. Wentzloff	[2]

Last update Mon Jun 4 20:40:43 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page