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| 2009 | ||
|---|---|---|
| 2 | Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun: Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests. Microelectronics Reliability 49(1): 42-50 (2009) | |
| 2007 | ||
| 1 | Dong Il Kim, Chang-Mook Choi, Rui Li, Dae Hee Lee: A Study on Electromagnetic Wave Absorber for W-Band Radars Using Permalloy. IEICE Transactions 90-B(8): 2138-2142 (2007) | |
| 1 | Chang-Mook Choi | [1] |
| 2 | Su Chang Jeon | [2] |
| 3 | Dong Il Kim | [1] |
| 4 | Rui Li | [1] |
| 5 | Keun Ho Rhew | [2] |
| 6 | Byueng-Su Yoo | [2] |
| 7 | Ilgu Yun | [2] |
Colors in the list of coauthors
Last update Mon Jun 4 20:40:43 2012 CET by the DBLP Team —
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