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Chihoon Lee Coauthor index pubzone.org

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DBLP keys2011
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAmarjit Budhiraja, Arka P. Ghosh, Chihoon Lee: Ergodic Rate Control Problem for Single Class Queueing Networks. SIAM J. Control and Optimization 49(4): 1570-1606 (2011)
2010
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChihoon Lee: V-uniform ergodicity for state-dependent single class queueing networks. Queueing Syst. 65(1): 93-108 (2010)
2009
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChihoon Lee, Doohyung Lee, Jahwan Koo, Jin-Wook Chung: Proactive Fault Detection Schema for Enterprise Information System Using Statistical Process Control. HCI (8) 2009: 113-122
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSangtae Bae, Doohyung Lee, Chihoon Lee, Jinwook Chung, Jahwan Koo, Suman Banerjee: An End-to-End Proactive TCP Based on Available Bandwidth Estimation with Congestion Level Index. HCI (9) 2009: 124-130
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLAmarjit Budhiraja, Chihoon Lee: Stationary Distribution Convergence for Generalized Jackson Networks in Heavy Traffic. Math. Oper. Res. 34(1): 45-56 (2009)
2007
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDoohyung Lee, Chihoon Lee, Jahwan Koo, Jin-Wook Chung: Correlation Analysis of Available Bandwidth Estimators for Mobile HCI. HCI (8) 2007: 687-696
2006
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChihoon Lee, Jin-Wook Chung, Sung Woo Shin: Network Intrusion Detection Through Genetic Feature Selection. SNPD 2006: 109-114
2003
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLChihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee: Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide. Microelectronics Reliability 43(5): 735-739 (2003)

Coauthor Index

1Sangtae Bae [5]
2Suman Banerjee [5]
3Amarjit Budhiraja [4] [8]
4Jin-Wook Chung (Jinwook Chung) [2] [3] [5] [6]
5Arka P. Ghosh [8]
6Hyeong Joon Kim [1]
7Jahwan Koo [3] [5] [6]
8Doohyung Lee [3] [5] [6]
9Wonshik Lee [1]
10Donggun Park [1]
11Sung Woo Shin [2]

Colors in the list of coauthors

Last update Mon Jun 4 20:40:43 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page