Byoung Hun Lee

	2007
2		Chadwin D. Young, Dawei Heh, Arnost Neugroschel, Rino Choi, Byoung Hun Lee, Gennadi Bersuker: Electrical characterization and analysis techniques for the high-kappa era. Microelectronics Reliability 47(4-5): 479-488 (2007)
	2005
1		Chadwin D. Young, Gennadi Bersuker, Yuegang Zhao, Jeff J. Peterson, Joel Barnett, George A. Brown, Jang H. Sim, Rino Choi, Byoung Hun Lee, Peter Zeitzoff: Probing stress effects in HfO2 gate stacks with time dependent measurements. Microelectronics Reliability 45(5-6): 806-810 (2005)

Coauthor Index

1	Joel Barnett	[1]
2	Gennadi Bersuker	[1] [2]
3	George A. Brown	[1]
4	Rino Choi	[1] [2]
5	Dawei Heh	[2]
6	Arnost Neugroschel	[2]
7	Jeff J. Peterson	[1]
8	Jang H. Sim	[1]
9	Chadwin D. Young	[1] [2]
10	Peter Zeitzoff	[1]
11	Yuegang Zhao	[1]

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