 | 2011 |
| 8 |  | Yolanda Lechuga,
Román Mozuelos,
Mar Martínez,
Salvador Bracho:
Design-for-Test method for high-speed ADCs: Behavioral description and optimization.
DDECS 2011: 35-40 |
| 7 |  | Román Mozuelos,
Yolanda Lechuga,
Mar Martínez,
Salvador Bracho:
Structural Test Approach for Embedded Analog Circuits Based on a Built-in Current Sensor.
J. Electronic Testing 27(2): 177-192 (2011) |
| 2010 |
| 6 |  | Román Mozuelos,
Yolanda Lechuga,
Mar Martínez,
Salvador Bracho:
Test Based on Built-In Current Sensors for Mixed-Signal Circuits.
DoCEIS 2010: 523-530 |
| 5 |  | Yolanda Lechuga,
Román Mozuelos,
Mar Martínez,
Salvador Bracho:
Structural DfT Strategy for High-Speed ADCs.
DoCEIS 2010: 531-538 |
| 4 |  | Román Mozuelos,
Yolanda Lechuga,
Mar Martínez,
Salvador Bracho:
Test of embedded analog circuits based on a built-in current sensor.
European Test Symposium 2010: 164-169 |
| 2005 |
| 3 |  | Yolanda Lechuga,
Román Mozuelos,
M. A. Allende,
Mar Martínez,
Salvador Bracho:
Fault Detection in Switched Current Circuits Using Built-in Transient Current Sensors.
J. Electronic Testing 21(6): 583-598 (2005) |
| 2 |  | Román Mozuelos,
Yolanda Lechuga,
Mar Martínez,
Salvador Bracho:
Test of a switched-capacitor ADC by a built-in charge sensor.
Microelectronics Journal 36(12): 1064-1072 (2005) |
| 2002 |
| 1 |  | Yolanda Lechuga,
Román Mozuelos,
Mar Martínez,
Salvador Bracho:
Built-In Dynamic Current Sensor for Hard-to-Detect Faults in Mixed-Signal Ics.
DATE 2002: 205-211 |