 | 2012 |
|---|
| 7 |       | E. Herth,
H. Desré,
E. Algré,
C. Legrand,
T. Lasri:
Investigation of optical and chemical bond properties of hydrogenated amorphous silicon nitride for optoelectronics applications.
Microelectronics Reliability 52(1): 141-146 (2012) |
| 2011 |
|---|
| 6 | | K. Haddadi,
M. M. Wang,
D. Glay,
T. Lasri:
Performance of a Compact Dual Six-Port Millimeter-Wave Network Analyzer.
IEEE T. Instrumentation and Measurement 60(9): 3207-3213 (2011) |
| 2010 |
|---|
| 5 | | E. Herth,
Bernard Legrand,
Lionel Buchaillot,
N. Rolland,
T. Lasri:
Optimization of SiNX: H films deposited by PECVD for reliability of electronic, microsystems and optical applications.
Microelectronics Reliability 50(8): 1103-1106 (2010) |
| 2009 |
|---|
| 4 | | C. Beaucamp-Ricard,
L. Dubois,
Sebastian Vaucher,
P.-Y. Cresson,
T. Lasri,
Joseph Pribetich:
Temperature Measurement by Microwave Radiometry: Application to Microwave Sintering.
IEEE T. Instrumentation and Measurement 58(5): 1712-1719 (2009) |
| 2008 |
|---|
| 3 | | O. Benzaim,
K. Haddadi,
M. M. Wang,
M. Maazi,
D. Glay,
T. Lasri:
Scanning Near-Field Millimeter-Wave Microscope: Application to a Vector-Coding Technique.
IEEE T. Instrumentation and Measurement 57(11): 2392-2397 (2008) |
| 2 | | M. Maazi,
O. Benzaim,
D. Glay,
T. Lasri:
Detection and Characterization of Buried Macroscopic Cracks Inside Dielectric Materials by Microwave Techniques and Artificial Neural Networks.
IEEE T. Instrumentation and Measurement 57(12): 2819-2826 (2008) |
| 2006 |
|---|
| 1 | | K. Haddadi,
D. Glay,
T. Lasri:
Homodyne dual six-port network analyzer and associated calibration technique for millimeter wave measurements.
ISCAS 2006 |
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