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| 2012 | ||
|---|---|---|
| 59 | Breeta SenGupta, Urban Ingelsson, Erik Larsson: Test Planning for Core-based 3D Stacked ICs with Through-Silicon Vias. VLSI Design 2012: 442-447 | |
| 58 | Breeta SenGupta, Urban Ingelsson, Erik Larsson: Scheduling Tests for 3D Stacked Chips under Power Constraints. J. Electronic Testing 28(1): 121-135 (2012) | |
| 2011 | ||
| 57 | Farrokh Ghani Zadegan, Urban Ingelsson, Golnaz Asani, Gunnar Carlsson, Erik Larsson: Test Scheduling in an IEEE P1687 Environment with Resource and Power Constraints. Asian Test Symposium 2011: 525-531 | |
| 56 | Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Design automation for IEEE P1687. DATE 2011: 1412-1417 | |
| 55 | Urban Ingelsson, Shih-Yen Chang, Erik Larsson: Measurement point selection for in-operation wear-out monitoring. DDECS 2011: 381-386 | |
| 54 | Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson: Adaptive execution assistance for multiplexed fault-tolerant chip multiprocessors. ICCD 2011: 419-426 | |
| 2010 | ||
| 53 | Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson: Energy-efficient redundant execution for chip multiprocessors. ACM Great Lakes Symposium on VLSI 2010: 143-146 | |
| 52 | Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara: Graph theoretic approach for scan cell reordering to minimize peak shift power. ACM Great Lakes Symposium on VLSI 2010: 73-78 | |
| 51 | Mudassar Majeed, Daniel Ahlstrom, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Efficient Embedding of Deterministic Test Data. Asian Test Symposium 2010: 159-162 | |
| 50 | Farrokh Ghani Zadegan, Urban Ingelsson, Gunnar Carlsson, Erik Larsson: Test Time Analysis for IEEE P1687. Asian Test Symposium 2010: 455-460 | |
| 49 | Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson: Multiplexed redundant execution: A technique for efficient fault tolerance in chip multiprocessors. DATE 2010: 1572-1577 | |
| 48 | Dimitar Nikolov, Urban Ingelsson, Virendra Singh, Erik Larsson: Estimating Error-probability and its Application for Optimizing Roll-back Recovery with Checkpointing. DELTA 2010: 281-285 | |
| 47 | Pramod Subramanyan, Virendra Singh, Kewal K. Saluja, Erik Larsson: Energy-efficient fault tolerance in chip multiprocessors using Critical Value Forwarding. DSN 2010: 121-130 | |
| 46 | N. S. Vinay, Indira Rawaty, Erik Larsson, M. S. Gaur, Virendra Singh: Thermal aware test scheduling for stacked multi-chip-modules. EWDTS 2010: 343-349 | |
| 45 | Erik Larsson, Bart Vermeulen, Kees Goossens: A distributed architecture to check global properties for post-silicon debug. European Test Symposium 2010: 182-187 | |
| 44 | Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Hideo Fujiwara: Scan cell reordering to minimize peak power during test cycle: A graph theoretic approach. European Test Symposium 2010: 259 | |
| 2009 | ||
| 43 | Dan Adolfsson, Joanna Siew, Erik Jan Marinissen, Erik Larsson: On Scan Chain Diagnosis for Intermittent Faults. Asian Test Symposium 2009: 47-54 | |
| 42 | Mikael Väyrynen, Virendra Singh, Erik Larsson: Fault-tolerant average execution time optimization for general-purpose multi-processor system-on-chips. DATE 2009: 484-489 | |
| 41 | Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, Vishwani D. Agrawal: On Minimization of Peak Power for Scan Circuit during Test. European Test Symposium 2009: 25-30 | |
| 2008 | ||
| 40 | Anders Larsson, Erik Larsson, Krishnendu Chakrabarty, Petru Eles, Zebo Peng: Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns. DATE 2008: 188-193 | |
| 39 | Anders Larsson, Xin Zhang, Erik Larsson, Krishnendu Chakrabarty: SOC Test Optimization with Compression-Technique Selection. ITC 2008: 1 | |
| 38 | Soheil Samii, Mikko Selkälä, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng: Cycle-Accurate Test Power Modeling and Its Application to SoC Test Architecture Design and Scheduling. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 973-977 (2008) | |
| 37 | Erik Larsson: Architecture for integrated test data compression and abort-on-fail testing in a multi-site environment. IET Computers & Digital Techniques 2(4): 275-284 (2008) | |
| 36 | Erik Larsson, Zebo Peng: A Reconfigurable Power Conscious Core Wrapper and its Application to System-on-Chip Test Scheduling. J. Electronic Testing 24(5): 497-504 (2008) | |
| 2007 | ||
| 35 | Erik Larsson, Jon Persson: An Architecture for Combined Test Data Compression and Abort-on-Fail Test. ASP-DAC 2007: 726-731 | |
| 34 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng: Optimized integration of test compression and sharing for SOC testing. DATE 2007: 207-212 | |
| 33 | Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, Clemens Wouters: Test quality analysis and improvement for an embedded asynchronous FIFO. DATE 2007: 859-864 | |
| 32 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng: A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing. DDECS 2007: 61-66 | |
| 31 | Gunnar Carlsson, Johan Holmqvist, Erik Larsson: Protocol requirements in an SJTAG/IJTAG environment. ITC 2007: 1-9 | |
| 30 | Erik Larsson, Mehdi Amirijoo, Daniel Karlsson, Petru Eles: What impacts course evaluation? ITiCSE 2007: 333 | |
| 29 | Erik Larsson, Per Lindahl, Petter Mostad: HeliCis: a DNA motif discovery tool for colocalized motif pairs with periodic spacing. BMC Bioinformatics 8: (2007) | |
| 28 | Erik Larsson, Stina Edbom: Test data truncation for test quality maximisation under ATE memory depth constraint. IET Computers & Digital Techniques 1(1): 27-37 (2007) | |
| 2006 | ||
| 27 | Soheil Samii, Erik Larsson, Krishnendu Chakrabarty, Zebo Peng: Cycle-Accurate Test Power Modeling and its Application to SoC Test Scheduling. ITC 2006: 1-10 | |
| 26 | Erik Larsson, Zebo Peng: Power-Aware Test Planning in the Early System-on-Chip Design Exploration Process. IEEE Trans. Computers 55(2): 227-239 (2006) | |
| 25 | Erik Larsson, Hideo Fujiwara: System-on-chip test scheduling with reconfigurable core wrappers. IEEE Trans. VLSI Syst. 14(3): 305-309 (2006) | |
| 2005 | ||
| 24 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng: SOC Test Scheduling with Test Set Sharing and Broadcasting. Asian Test Symposium 2005: 162-169 | |
| 23 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng: Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip. DSD 2005: 403-411 | |
| 22 | David Bäckström, Gunnar Carlsson, Erik Larsson: Remote boundary-scan system test control for the ATCA standard. ITC 2005: 10 | |
| 21 | Erik Larsson, Stina Edbom: Combined Test Data Selection and Scheduling for Test Quality Optimization under ATE Memory Depth Constraint. VLSI-SoC 2005: 221-244 | |
| 20 | Julien Pouget, Erik Larsson, Zebo Peng: Multiple-Constraint Driven System-on-Chip Test Time Optimization. J. Electronic Testing 21(6): 599-611 (2005) | |
| 19 | Erik Larsson, Julien Pouget, Zebo Peng: Abort-on-Fail Based Test Scheduling. J. Electronic Testing 21(6): 651-658 (2005) | |
| 2004 | ||
| 18 | Stina Edbom, Erik Larsson: An Integrated Technique for Test Vector Selection and Test Scheduling under Test Time Constraint. Asian Test Symposium 2004: 254-257 | |
| 17 | Erik Larsson: Integrating Core Selection in the SOC Test Solution Design-Flow. ITC 2004: 1349-1358 | |
| 16 | Erik Larsson, Anders Larsson: Student-oriented examination in a computer architecture course. ITiCSE 2004: 245 | |
| 15 | Erik Larsson, Julien Pouget, Zebo Peng: Defect-Aware SOC Test Scheduling. VTS 2004: 361-366 | |
| 14 | Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Efficient test solutions for core-based designs. IEEE Trans. on CAD of Integrated Circuits and Systems 23(5): 758-775 (2004) | |
| 13 | Erik Larsson, Hideo Fujiwara: Preemptive System-on-Chip Test Scheduling. IEICE Transactions 87-D(3): 620-629 (2004) | |
| 2003 | ||
| 12 | Erik Larsson, Hideo Fujiwara: Optimal System-on-Chip Test Scheduling. Asian Test Symposium 2003: 306-311 | |
| 11 | Julien Pouget, Erik Larsson, Zebo Peng: SOC Test Time Minimization Under Multiple Constraints. Asian Test Symposium 2003: 312-317 | |
| 10 | Anders Larsson, Erik Larsson, Petru Eles, Zebo Peng: Buffer and Controller Minimisation for Time-Constrained Testing of System-On-Chip. DFT 2003: 385-392 | |
| 9 | Erik Larsson, Zebo Peng: A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling. ITC 2003: 1135-1144 | |
| 8 | Erik Larsson, Hideo Fujiwara: Test Resource Partitioning and Optimization for SOC Designs. VTS 2003: 319-324 | |
| 2002 | ||
| 7 | Erik Larsson, Klas Arvidsson, Hideo Fujiwara, Zebo Peng: Integrated Test Scheduling, Test Parallelization and TAMDesign. Asian Test Symposium 2002: 397-404 | |
| 6 | Erik Larsson, Zebo Peng: An Integrated Framework for the Design and Optimization of SOC Test Solutions. J. Electronic Testing 18(4-5): 385-400 (2002) | |
| 2001 | ||
| 5 | Erik Larsson, Zebo Peng: Test Scheduling and Scan-Chain Division under Power Constraint. Asian Test Symposium 2001: 259-264 | |
| 4 | Erik Larsson, Zebo Peng: An integrated system-on-chip test framework. DATE 2001: 138-144 | |
| 3 | Erik Larsson, Zebo Peng, Gunnar Carlsson: The Design and Optimization of SOC Test Solutions. ICCAD 2001: 523-530 | |
| 2000 | ||
| 2 | John Saul, Betsy Black, Erik Larsson: Helpdesk.Drew.Edu: Home Growing a Helpdesk Solution Using Open-Source Technology. SIGUCCS 2000: 289-293 | |
| 1997 | ||
| 1 | Xinli Gu, Erik Larsson, Krzysztof Kuchcinski, Zebo Peng: A controller testability analysis and enhancement technique. ED&TC 1997: 153-157 | |
Colors in the list of coauthors
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