 | 2005 |
|---|
| 7 |       | S. Huyghe,
L. Béchou,
N. Zerounian,
Y. Deshayes,
F. Aniel,
A. Denolle,
D. Laffitte,
J. L. Goudard,
Y. Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectronics Reliability 45(9-11): 1593-1599 (2005) |
| 2003 |
|---|
| 6 | | Y. Deshayes,
L. Béchou,
J.-Y. Delétage,
F. Verdier,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectronics Reliability 43(7): 1125-1136 (2003) |
| 5 | | L. Mendizabal,
Jean-Louis Verneuil,
L. Béchou,
Christelle Aupetit-Berthelemot,
Y. Deshayes,
F. Verdier,
Jean-Michel Dumas,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectronics Reliability 43(9-11): 1743-1749 (2003) |
| 4 | | J. Van de Casteele,
D. Laffitte,
G. Gelly,
C. Starck,
M. Bettiati:
High reliability level demonstrated on 980nm laser diode.
Microelectronics Reliability 43(9-11): 1751-1754 (2003) |
| 3 | | C. Gautier,
J. Périnet,
E. Nissou,
D. Laffitte:
New method of qualification applied to optical amplifier with electronics.
Microelectronics Reliability 43(9-11): 1761-1766 (2003) |
| 2 | | J. L. Goudard,
X. Boddaert,
J. Périnet,
D. Laffitte:
Reliability of optoelectronics components: towards new qualification practices.
Microelectronics Reliability 43(9-11): 1767-1769 (2003) |
| 2002 |
|---|
| 1 | | J. L. Goudard,
P. Berthier,
X. Boddaert,
D. Laffitte,
J. Périnet:
New qualification approach for optoelectronic components.
Microelectronics Reliability 42(9-11): 1307-1310 (2002) |
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