Hee Ju Kwon

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2009

1 Byungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)

	2009
1		Byungwhan Kim, Hee Ju Kwon, Seongjin Choi: Use of adaptive network fuzzy inference system to predict plasma charging damage on electrical MOSFET properties. Expert Syst. Appl. 36(3): 6570-6573 (2009)

Coauthor Index

1 Seongjin Choi [1]

2 Byungwhan Kim [1]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team —

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