Byung-Heon Kwak

	2008
1		Jung-Eun Seok, Hyun-Joo Kim, Jae-Yong Seo, Sam-jin Hwang, Byung-Heon Kwak: Optimization of gate poly TAB size and reliability on short channel pMOSFET. Microelectronics Reliability 48(8-9): 1185-1188 (2008)

Coauthor Index

1	Sam-jin Hwang	[1]
2	Hyun-Joo Kim	[1]
3	Jae-Yong Seo	[1]
4	Jung-Eun Seok	[1]

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