 | 2005 |
| 10 |  | Kumar L. Parthasarathy,
Turker Kuyel,
Zhongjun Yu,
Degang Chen,
Randall L. Geiger:
A 16-bit resistor string DAC with full-calibration at final test.
ITC 2005: 10 |
| 9 |  | Le Jin,
Kumar L. Parthasarathy,
Turker Kuyel,
Randall L. Geiger,
Degang Chen:
High-performance ADC linearity test using low-precision signals in non-stationary environments.
ITC 2005: 10 |
| 8 |  | Le Jin,
Kumar L. Parthasarathy,
Turker Kuyel,
Degang Chen,
Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.
IEEE T. Instrumentation and Measurement 54(3): 1188-1199 (2005) |
| 2003 |
| 7 |  | Kumar L. Parthasarathy,
Le Jin,
Turker Kuyel,
Dana Price,
Degang Chen,
Randall L. Geiger:
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.
ISCAS (5) 2003: 537-540 |
| 6 |  | Le Jin,
Kumar L. Parthasarathy,
Turker Kuyel,
Degang Chen,
Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.
ITC 2003: 218-227 |
| 5 |  | Kumar L. Parthasarathy,
Turker Kuyel,
Dana Price,
Le Jin,
Degang Chen,
Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus.
ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) |
| 2000 |
| 4 |  | Turker Kuyel,
Frank Tsay:
Optimal analog trim techniques for improving the linearity of pipeline ADCs.
ITC 2000: 367-375 |
| 1999 |
| 3 |  | Turker Kuyel:
Linearity testing issues of analog to digital converters.
ITC 1999: 747-756 |
| 2 |  | Turker Kuyel,
Haydar Bilhan:
Relating linearity test results to design flaws of pipelined analog to digital converters.
ITC 1999: 772-779 |
| 1 |  | Turker Kuyel,
Wilson S. Geisler,
Joydeep Ghosh:
Fast image classification using a sequence of visual fixations.
IEEE Transactions on Systems, Man, and Cybernetics, Part B 29(2): 304-308 (1999) |