H. Kurz

	2009
5		R. Peibst, T. Dürkop, E. Bugiel, N. Koo, T. Mollenhauer, M. C. Lemme, H. Kurz, K. R. Hofmann: PECVD grown Ge nanocrystals embedded in SiO2: From disordered to templated self-organization. Microelectronics Journal 40(4-5): 759-761 (2009)
	2007
4		V. I. Turchanikov, A. N. Nazarov, V. S. Lysenko, V. Ostahov, O. Winkler, B. Spangenberg, H. Kurz: Charge accumulation in the dielectric of the nanocluster NVM MOS structures under anti- and unipolar W/E window formation. Microelectronics Reliability 47(4-5): 626-630 (2007)
	2005
3		R. Rölver, O. Winkler, M. Först, B. Spangenberg, H. Kurz: Light emission from Si/SiO2 superlattices fabricated by RPECVD. Microelectronics Reliability 45(5-6): 915-918 (2005)
2		M. C. Lemme, J. K. Efavi, H. D. B. Gottlob, T. Mollenhauer, T. Wahlbrink, H. Kurz: Comparison of metal gate electrodes on MOCVD HfO2. Microelectronics Reliability 45(5-6): 953-956 (2005)
	1998
1		J. Fischer, C. Müller, H. Kurz: A Co-simulation Concept for an Efficient Analysis of Complex Logic Designs. FPL 1998: 495-499

Coauthor Index

1	E. Bugiel	[5]
2	T. Dürkop	[5]
3	J. K. Efavi	[2]
4	J. Fischer	[1]
5	M. Först	[3]
6	H. D. B. Gottlob	[2]
7	K. R. Hofmann	[5]
8	N. Koo	[5]
9	M. C. Lemme	[2] [5]
10	V. S. Lysenko	[4]
11	T. Mollenhauer	[2] [5]
12	C. Müller	[1]
13	A. N. Nazarov	[4]
14	V. Ostahov	[4]
15	R. Peibst	[5]
16	R. Rölver	[3]
17	B. Spangenberg	[3] [4]
18	V. I. Turchanikov	[4]
19	T. Wahlbrink	[2]
20	O. Winkler	[3] [4]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page