 | 2009 |
| 3 |  | Yoshino K. Fukai,
Kenji Kurishima,
Norihide Kashio,
Minoru Ida,
Shoji Yamahata,
Takatomo Enoki:
Emitter-metal-related degradation in InP-based HBTs operating at high current density and its suppression by refractory metal.
Microelectronics Reliability 49(4): 357-364 (2009) |
| 2008 |
| 2 |  | Norihide Kashio,
Kenji Kurishima,
Yoshino K. Fukai,
Shoji Yamahata:
Highly Reliable Submicron InP-Based HBTs with over 300-GHz ft.
IEICE Transactions 91-C(7): 1084-1090 (2008) |
| 2005 |
| 1 |  | Hideyuki Nosaka,
Makoto Nakamura,
Kimikazu Sano,
Minoru Ida,
Kenji Kurishima,
Tsugumichi Shibata,
Masami Tokumitsu,
Masahiro Muraguchi:
A 24-Gsps 3-Bit Nyquist ADC Using InP HBTs for DSP-Based Electronic Dispersion Compensation.
IEICE Transactions 88-C(6): 1225-1232 (2005) |