Masanori Kurimoto

	2012
6		Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui, Michio Komoda, Nobuhiro Tsuda: A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule. ACM Trans. Design Autom. Electr. Syst. 17(2): 17 (2012)
	2010
5		Masanori Kurimoto, Jun Matsushima, Shigeki Ohbayashi, Yoshiaki Fukui: A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule. ISQED 2010: 184-190
4		Masanori Kurimoto, Hiroaki Suzuki, Rei Akiyama, Tadao Yamanaka, Haruyuki Ohkuma, Hidehiro Takata, Hirofumi Shinohara: Phase-adjustable error detection flip-flops with 2-stage hold-driven optimization, slack-based grouping scheme and slack distribution control for dynamic voltage scaling. ACM Trans. Design Autom. Electr. Syst. 15(2): (2010)
	2009
3		Mitsuya Fukazawa, Masanori Kurimoto, Rei Akiyama, Hidehiro Takata, Makoto Nagata: Experimental Evaluation of Dynamic Power Supply Noise and Logical Failures in Microprocessor Operations. IEICE Transactions 92-C(4): 475-482 (2009)
	2008
2		Masanori Kurimoto, Hiroaki Suzuki, Rei Akiyama, Tadao Yamanaka, Haruyuki Ohkuma, Hidehiro Takata, Hirofumi Shinohara: Phase-adjustable error detection flip-flops with 2-stage hold driven optimization and slack based grouping scheme for dynamic voltage scaling. DAC 2008: 884-889
1		Hiroaki Suzuki, Masanori Kurimoto, Tadao Yamanaka, Hidehiro Takata, Hiroshi Makino, Hirofumi Shinohara: Post-silicon programmed body-biasing platform suppressing device variability in 45 nm CMOS technology. ISLPED 2008: 15-20

Coauthor Index

1	Rei Akiyama	[2] [3] [4]
2	Mitsuya Fukazawa	[3]
3	Yoshiaki Fukui	[5] [6]
4	Michio Komoda	[6]
5	Hiroshi Makino	[1]
6	Jun Matsushima	[5] [6]
7	Makoto Nagata	[3]
8	Shigeki Ohbayashi	[5] [6]
9	Haruyuki Ohkuma	[2] [4]
10	Hirofumi Shinohara	[1] [2] [4]
11	Hiroaki Suzuki	[1] [2] [4]
12	Hidehiro Takata	[1] [2] [3] [4]
13	Nobuhiro Tsuda	[6]
14	Tadao Yamanaka	[1] [2] [4]

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