 | 2012 |
| 9 |  | Nathan Kupp,
Yiorgos Makris:
Applying the Model-View-Controller Paradigm to Adaptive Test.
IEEE Design & Test of Computers 29(1): 28-35 (2012) |
| 2011 |
| 8 |  | Nathan Kupp,
Mustapha Slamani,
Yiorgos Makris:
Correlating inline data with final test outcomes in analog/RF devices.
DATE 2011: 812-817 |
| 7 |  | Nathan Kupp,
Haralampos-G. D. Stratigopoulos,
Petros Drineas,
Yiorgos Makris:
On proving the efficiency of alternative RF tests.
ICCAD 2011: 762-767 |
| 6 |  | Nathan Kupp,
He Huang,
Yiorgos Makris,
Petros Drineas:
Improving Analog and RF Device Yield through Performance Calibration.
IEEE Design & Test of Computers 28(3): 64-75 (2011) |
| 2010 |
| 5 |  | Yier Jin,
Nathan Kupp,
Yiorgos Makris:
DFTT: Design for Trojan Test.
ICECS 2010: 1168-1171 |
| 4 |  | Nathan Kupp,
He Huang,
Petros Drineas,
Yiorgos Makris:
Post-production performance calibration in analog/RF devices.
ITC 2010: 245-254 |
| 2009 |
| 3 |  | Yier Jin,
Nathan Kupp,
Yiorgos Makris:
Experiences in Hardware Trojan Design and Implementation.
HOST 2009: 50-57 |
| 2 |  | Nathan Kupp,
Petros Drineas,
Mustapha Slamani,
Yiorgos Makris:
On Boosting the Accuracy of Non-RF to RF Correlation-Based Specification Test Compaction.
J. Electronic Testing 25(6): 309-321 (2009) |
| 2008 |
| 1 |  | Nathan Kupp,
Petros Drineas,
Mustapha Slamani,
Yiorgos Makris:
Confidence Estimation in Non-RF to RF Correlation-Based Specification Test Compaction.
European Test Symposium 2008: 35-40 |