Fred G. Kuper

	2008
13		Fred G. Kuper: Automotive IC reliability: Elements of the battle towards zero defects. Microelectronics Reliability 48(8-9): 1459-1463 (2008)
12		Guido T. Sasse, Mustafa Acar, Fred G. Kuper, Jurriaan Schmitz: RF CMOS reliability simulations. Microelectronics Reliability 48(8-9): 1581-1585 (2008)
	2006
11		Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz: Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectronics Reliability 46(9-11): 1617-1622 (2006)
	2005
10		M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectronics Reliability 45(9-11): 1425-1429 (2005)
	2004
9		Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper: Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectronics Reliability 44(8): 1269-1273 (2004)
	2003
8		Yuan Li, Klaas Jelle Veenstra, Jérôme Dubois, Lei Peters-Wu, Agnes van Zomeren, Fred G. Kuper: Reservoir effect and maximum allowed VIA misalignment for AlCu interconnect with tungsten VIA plug. Microelectronics Reliability 43(9-11): 1449-1454 (2003)
7		M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectronics Reliability 43(9-11): 1569-1575 (2003)
	2002
6		N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan: Zapping thin film transistors. Microelectronics Reliability 42(4-5): 747-765 (2002)
5		M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectronics Reliability 42(9-11): 1287-1292 (2002)
4		H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, B. Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper: Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling. Microelectronics Reliability 42(9-11): 1415-1420 (2002)
3		H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper: Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability 42(9-11): 1421-1425 (2002)
	2001
2		Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper: Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability 41(3): 395-405 (2001)
1		N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan: The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. Microelectronics Reliability 41(9-10): 1391-1396 (2001)

Coauthor Index

1	Mustafa Acar	[12]
2	Jaap Bisschop	[4]
3	Gianluca Boselli	[2]
4	Kitty van Dijk	[9]
5	Jérôme Dubois	[8]
6	N. Tosic Golo	[1] [6]
7	André J. Hof	[11]
8	Peter C. de Jong	[10]
9	B. Krabbenborg	[4]
10	Yuan Li	[8]
11	Leo van Marwijk	[9]
12	Stan Meeuwsen	[2]
13	A. J. Mouthaan	[3] [4]
14	Ton J. Mouthaan	[1] [2] [5] [6] [7] [10]
15	H. V. Nguyen	[3] [4]
16	Lei Peters-Wu	[8]
17	Cora Salm	[3] [4] [5] [7] [10] [11]
18	Guido T. Sasse	[12]
19	Andrea Scarpa	[9]
20	Jurriaan Schmitz	[11] [12]
21	Theo Smedes	[5] [7] [10]
22	M. S. B. Sowariraj	[5] [7] [10]
23	Guoqiao Tao	[9]
24	Klaas Jelle Veenstra	[8]
25	J. Voets	[4]
26	J. Vroemen	[4]
27	S. van der Wal	[1]
28	R. Wenzel	[3]
29	Agnes van Zomeren	[8]

Colors in the list of coauthors

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page