Ben Kup

	2010
3		Maurice Meijer, José Pineda de Gyvez, Ben Kup, Bert van Uden, Peter Bastiaansen, Marco Lammers, Maarten Vertregt: A forward body bias generator for digital CMOS circuits with supply voltage scaling. ISCAS 2010: 2482-2485
	2002
2		Rodger Schuttert, Frans de Jong, Ben Kup: Improved Test Monitor Circuit in Power Pin DfT. VTS 2002: 345-350
	2000
1		Frans de Jong, Ben Kup, Rodger Schuttert: Power pin testing: making the test coverage complete. ITC 2000: 575-584

Coauthor Index

1	Peter Bastiaansen	[3]
2	José Pineda de Gyvez	[3]
3	Frans de Jong (F. G. M. de Jong)	[1] [2]
4	Marco Lammers	[3]
5	Maurice Meijer	[3]
6	Rodger Schuttert	[1] [2]
7	Bert van Uden	[3]
8	Maarten Vertregt	[3]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page