E. Kunnen

	2005
1		E. Sleeckx, Marc Schaekers, X. Shi, E. Kunnen, B. Degroote, M. Jurczak, M. de Potter de ten Broeck, E. Augendre: Optimization of low temperature silicon nitride processes for improvement of device performance. Microelectronics Reliability 45(5-6): 865-868 (2005)

Coauthor Index

1	E. Augendre	[1]
2	M. de Potter de ten Broeck	[1]
3	B. Degroote	[1]
4	M. Jurczak	[1]
5	Marc Schaekers	[1]
6	X. Shi	[1]
7	E. Sleeckx	[1]

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