dblp.uni-trier.dewww.dagstuhl.dewww.uni-trier.de

Shigetaka Kumashiro Coauthor index pubzone.org

List of publications from the DBLP Bibliography Server - FAQ
Ask others: ACM DL/Guide - CiteSeerX - CSB - MetaPress - Google - Bing - Yahoo

DBLP keys2012
12Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLHironori Sakamoto, Shigetaka Kumashiro, Shigeo Sato, Naoki Wakita, Tohru Mogami: HiSIM-RP: A reverse-profiling based 1st principles compact MOSFET model and its application to variability analysis of 90nm and 40nm CMOS. ISQED 2012: 553-560
11Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata: On-Chip In-Place Measurements of Vth and Signal/Substrate Response of Differential Pair Transistors. IEICE Transactions 95-C(1): 137-145 (2012)
2011
10Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLSatoshi Takaya, Yoji Bando, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata: Accurate analysis of substrate sensitivity of active transistors in an analog circuit. ISQED 2011: 56-61
9Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLYoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Masaaki Souda, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata: A Continuous-Time Waveform Monitoring Technique for On-Chip Power Noise Measurements in VLSI Circuits. IEICE Transactions 94-C(4): 495-503 (2011)
8Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLMasaaki Souda, Yoji Bando, Satoshi Takaya, Toru Ohkawa, Toshiharu Takaramoto, Toshio Yamada, Shigetaka Kumashiro, Tohru Mogami, Makoto Nagata: On-Chip Single Tone Pseudo-Noise Generator for Analog IP Noise Tolerance Measurement. IEICE Transactions 94-C(6): 1024-1031 (2011)
2010
7Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKenta Yamada, Toshiyuki Syo, Hisao Yoshimura, Masaru Ito, Tatsuya Kunikiyo, Toshiki Kanamoto, Shigetaka Kumashiro: Exhaustive and Systematic Accuracy Verification and Enhancement of STI Stress Compact Model for General Realistic Layout Patterns. IEICE Transactions 93-C(8): 1349-1358 (2010)
2008
6Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLKenta Yamada, Takashi Sato, Shuhei Amakawa, Noriaki Nakayama, Kazuya Masu, Shigetaka Kumashiro: Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress. IEICE Transactions 91-C(7): 1142-1150 (2008)
5Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLTatsuya Ezaki, Dondee Navarro, Youichi Takeda, Norio Sadachika, G. Suzuki, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Takahiro Iizuka, Masahiko Taguchi, Shigetaka Kumashiro, Shunsuke Miyamoto: Non-quasi-static approach with surface-potential-based MOSFET model HiSIM for RF circuit simulations. Mathematics and Computers in Simulation 79(4): 1096-1106 (2008)
2005
4Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShizunori Matsumoto, Hiroaki Ueno, Satoshi Hosokawa, Toshihiko Kitamura, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Tatsuya Ohguro, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: 1/f-Noise Characteristics in 100 nm-MOSFETs and Its Modeling for Circuit Simulation. IEICE Transactions 88-C(2): 247-254 (2005)
3Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLDondee Navarro, Takeshi Mizoguchi, Masami Suetake, Kazuya Hisamitsu, Hiroaki Ueno, Mitiko Miura-Mattausch, Hans Jürgen Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: A Compact Model of the Pinch-off Region of 100 nm MOSFETs Based on the Surface-Potential. IEICE Transactions 88-C(5): 1079-1086 (2005)
2001
2Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLD. Miyawaki, Shizunori Matsumoto, Hans Jürgen Mattausch, S. Ooshiro, Masami Suetake, Michiko Miura-Mattausch, Shigetaka Kumashiro, Tetsuya Yamaguchi, Kyoji Yamashita, Noriaki Nakayama: Correlation method of circuit-performance and technology fluctuations for improved design reliability. ASP-DAC 2001: 39-44
1993
1Electronic Edition pubzone.org CiteSeerX Google scholar BibTeX bibliographical record in XMLShigetaka Kumashiro, Ronald A. Rohrer, Andrzej J. Strojwas: Asymptotic waveform evaluation for transient analysis of 3-D interconnect structures. IEEE Trans. on CAD of Integrated Circuits and Systems 12(7): 988-996 (1993)

Coauthor Index

1Shuhei Amakawa [6]
2Yoji Bando [8] [9] [10] [11]
3Tatsuya Ezaki [5]
4Kazuya Hisamitsu [3]
5Satoshi Hosokawa [4]
6Takahiro Iizuka [5]
7Masaru Ito [7]
8Toshiki Kanamoto [7]
9Toshihiko Kitamura [4]
10Tatsuya Kunikiyo [7]
11Kazuya Masu [6]
12Shizunori Matsumoto [2] [4]
13Hans Jürgen Mattausch [2] [3] [4] [5]
14Michiko Miura-Mattausch [2]
15Mitiko Miura-Mattausch [3] [4] [5]
16Shunsuke Miyamoto [5]
17D. Miyawaki [2]
18Takeshi Mizoguchi [3]
19Tohru Mogami [8] [9] [10] [11] [12]
20Makoto Nagata [8] [9] [10] [11]
21Noriaki Nakayama [2] [3] [4] [6]
22Dondee Navarro [3] [5]
23Tatsuya Ohguro [4] [5]
24Toru Ohkawa [8] [9] [10] [11]
25S. Ooshiro [2]
26Ronald A. Rohrer [1]
27Norio Sadachika [5]
28Hironori Sakamoto [12]
29Shigeo Sato [12]
30Takashi Sato [6]
31Masaaki Souda [8] [9] [10] [11]
32Andrzej J. Strojwas (Andreas J. Strojwas) [1]
33Masami Suetake [2] [3]
34G. Suzuki [5]
35Toshiyuki Syo [7]
36Masahiko Taguchi [5]
37Toshiharu Takaramoto [8] [9] [10] [11]
38Satoshi Takaya [8] [9] [10] [11]
39Youichi Takeda [5]
40Hiroaki Ueno [3] [4]
41Naoki Wakita [12]
42Kenta Yamada [6] [7]
43Toshio Yamada [8] [9] [10] [11]
44Tetsuya Yamaguchi [2] [3] [4]
45Kyoji Yamashita [2] [3] [4]
46Hisao Yoshimura [7]

Colors in the list of coauthors

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP TeamThis material is Open Data Data released under the ODC-BY 1.0 license — See also our legal information page