Barry D. Kulp

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1996

1 Barry D. Kulp: Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System. ITC 1996: 104-111

	1996
1		Barry D. Kulp: Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System. ITC 1996: 104-111

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