 | 2007 |
|---|
| 5 |       | Kunhyuk Kang,
Haldun Kufluoglu,
Kaushik Roy,
Muhammad Ashraful Alam:
Impact of Negative-Bias Temperature Instability in Nanoscale SRAM Array: Modeling and Analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1770-1781 (2007) |
| 4 | | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Negative Bias Temperature Instability: Estimation and Design for Improved Reliability of Nanoscale Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(4): 743-751 (2007) |
| 3 | | Muhammad Ashraful Alam,
Haldun Kufluoglu,
D. Varghese,
S. Mahapatra:
A comprehensive model for PMOS NBTI degradation: Recent progress.
Microelectronics Reliability 47(6): 853-862 (2007) |
| 2006 |
|---|
| 2 | | Bipul Chandra Paul,
Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Temporal performance degradation under NBTI: estimation and design for improved reliability of nanoscale circuits.
DATE 2006: 780-785 |
| 1 | | Kunhyuk Kang,
Haldun Kufluoglu,
Muhammad Ashraful Alam,
Kaushik Roy:
Efficient Transistor-Level Sizing Technique under Temporal Performance Degradation due to NBTI.
ICCD 2006 |
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