P. Kuekes

	1996
1		R. L. Campbell, P. Kuekes, David Y. Lepejian, W. Maly, Michael Nicolaidis, Alex Orailoglu: Can Defect-Tolerant Chips Better Meet the Quality Challenge? VTS 1996: 362-363

Coauthor Index

1	R. L. Campbell	[1]
2	David Y. Lepejian	[1]
3	W. Maly	[1]
4	Michael Nicolaidis	[1]
5	Alex Orailoglu	[1]

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