Thomas Kuehl

	2003
1		Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181

Coauthor Index

1	Abhijit Chatterjee	[1]
2	Sasikumar Cherubal	[1]
3	Bob Cometta	[1]
4	David M. Majernik	[1]
5	Randy Newby	[1]
6	Ramakrishna Voorakaranam	[1]

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