Tzu-Kun Ku

	2011
2		Shyh-Shyuan Sheu, Meng-Fan Chang, Ku-Feng Lin, Che-Wei Wu, Yu-Sheng Chen, Pi-Feng Chiu, Chia-Chen Kuo, Yih-Shan Yang, Pei-Chia Chiang, Wen-Pin Lin, Che-He Lin, Heng-Yuan Lee, Peiyi Gu, Sumin Wang, Frederick T. Chen, Keng-Li Su, Chen-Hsin Lien, Kuo-Hsing Cheng, Hsin-Tun Wu, Tzu-Kun Ku, Ming-Jer Kao, Ming-Jinn Tsai: A 4Mb embedded SLC resistive-RAM macro with 7.2ns read-write random-access time and 160ns MLC-access capability. ISSCC 2011: 200-202
	2001
1		Bing-Yue Tsui, Tsung-Ju Yang, Tzu-Kun Ku: Impact of interface nature on deep sub-micron Al-plug resistance. Microelectronics Reliability 41(11): 1889-1896 (2001)

Coauthor Index

1	Meng-Fan Chang	[2]
2	Frederick T. Chen	[2]
3	Yu-Sheng Chen	[2]
4	Kuo-Hsing Cheng	[2]
5	Pei-Chia Chiang	[2]
6	Pi-Feng Chiu	[2]
7	Peiyi Gu	[2]
8	Ming-Jer Kao	[2]
9	Chia-Chen Kuo	[2]
10	Heng-Yuan Lee	[2]
11	Chen-Hsin Lien	[2]
12	Che-He Lin	[2]
13	Ku-Feng Lin	[2]
14	Wen-Pin Lin	[2]
15	Shyh-Shyuan Sheu	[2]
16	Keng-Li Su	[2]
17	Ming-Jinn Tsai	[2]
18	Bing-Yue Tsui	[1]
19	Sumin Wang	[2]
20	Che-Wei Wu	[2]
21	Hsin-Tun Wu	[2]
22	Tsung-Ju Yang	[1]
23	Yih-Shan Yang	[2]

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