Prabhu Krishnamurthy

	2005
3		Prabhu Krishnamurthy: The Ultimate Chase. Asian Test Symposium 2005: 454
	2004
2		Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski: Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. ITC 2004: 1285-1294
	2003
1		Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040

Coauthor Index

1	Brady Benware	[1] [2]
2	Mark Kassab	[2]
3	Martin Keim	[2]
4	Cam Lu	[2]
5	Robert Madge	[1] [2]
6	Janusz Rajski	[1] [2]
7	Sreenevasan Ranganathan	[1]
8	Chris Schuermyer	[1]
9	John Van Slyke	[2]
10	Nagesh Tamarapalli	[1]
11	Kun-Han Tsai	[1]

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