P. Krishnamurthy

	2009
6		Narendra Devta-Prasanna, Sandeep Kumar Goel, Arun Gunda, Mark Ward, P. Krishnamurthy: Accurate measurement of small delay defect coverage of test patterns. ITC 2009: 1-10
	2006
5		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Test Generation for Open Defects in CMOS Circuits. DFT 2006: 41-49
4		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Unified Method to Detect Transistor Stuck-Open Faults and Transition Delay Faults. European Test Symposium 2006: 185-192
	2005
3		Narendra Devta-Prasanna, Sudhakar M. Reddy, Arun Gunda, P. Krishnamurthy, Irith Pomeranz: Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions. Asian Test Symposium 2005: 202-207
2		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: A Novel Method of Improving Transition Delay Fault Coverage Using Multiple Scan Enable Signals. ICCD 2005: 471-474
1		Narendra Devta-Prasanna, Arun Gunda, P. Krishnamurthy, Sudhakar M. Reddy, Irith Pomeranz: Methods for improving transition delay fault coverage using broadside tests. ITC 2005: 10

Coauthor Index

1	Narendra Devta-Prasanna	[1] [2] [3] [4] [5] [6]
2	Sandeep Kumar Goel	[6]
3	Arun Gunda	[1] [2] [3] [4] [5] [6]
4	Irith Pomeranz	[1] [2] [3] [4] [5]
5	Sudhakar M. Reddy	[1] [2] [3] [4] [5]
6	Mark Ward	[6]

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