Kannan Krishna

	1995
2		Kannan Krishna, Stephen W. Director: A novel methodology for statistical parameter extraction. ICCAD 1995: 696-699
1		Kannan Krishna, Stephen W. Director: The linearized performance penalty (LPP) method for optimization of parametric yield and its reliability. IEEE Trans. on CAD of Integrated Circuits and Systems 14(12): 1557-1568 (1995)

Coauthor Index

1

Stephen W. Director

[1] [2]

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