K. Krieg

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2001

1 K. Krieg, D. J. Thomson, Gregory E. Bridges: Electrical probing of deep sub-micron integrated circuits using scanning probes. Microelectronics Reliability 41(8): 1185-1191 (2001)

	2001
1		K. Krieg, D. J. Thomson, Gregory E. Bridges: Electrical probing of deep sub-micron integrated circuits using scanning probes. Microelectronics Reliability 41(8): 1185-1191 (2001)

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