A. Kovalski

	2001
1		O. Mrooz, A. Kovalski, J. Pogorzelska, O. Shpotyuk, M. Vakiv, Bohdan S. Butkiewicz, J. Maciak: Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits. Microelectronics Reliability 41(5): 773-777 (2001)

Coauthor Index

1	Bohdan S. Butkiewicz	[1]
2	J. Maciak	[1]
3	O. Mrooz	[1]
4	J. Pogorzelska	[1]
5	O. Shpotyuk	[1]
6	M. Vakiv	[1]

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