K. Kotani

	2008
1		Kan Takeuchi, A. Yoshikawa, M. Komoda, K. Kotani, Hiroaki Matsushita, Yusaku Katsuki, Y. Yamamoto, Takao Sato: Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. VLSI Syst. 16(11): 1559-1566 (2008)

Coauthor Index

1	Yusaku Katsuki	[1]
2	M. Komoda	[1]
3	Hiroaki Matsushita	[1]
4	Takao Sato	[1]
5	Kan Takeuchi	[1]
6	Y. Yamamoto	[1]
7	A. Yoshikawa	[1]

Last update Sun Jun 3 16:06:10 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page