Shouichi Koshizuka

	1988
1		Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Péter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum: Electron Beam Tester Integrated into a VLSI Tester. ITC 1988: 908-913

Coauthor Index

1	Péter Fazekas	[1]
2	Hans-Peter Feuerbaum	[1]
3	Hironobu Niijima	[1]
4	Mathias Sturm	[1]
5	Yasuo Tokunaga	[1]
6	Kazuo Yakuwa	[1]

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