Peter deBruyn Kops

	1982
1		Herold Levine, Charles Berking, Alan Blair, Kenneth R. Bowden, Peter deBruyn Kops, David Giles, David Ruhoff, Kenneth Wacks: Design of a New Test Generation System for Performance Testing of LSI Digital Printed Circuit Boards. ITC 1982: 541-547

Coauthor Index

1	Charles Berking	[1]
2	Alan Blair	[1]
3	Kenneth R. Bowden	[1]
4	David Giles	[1]
5	Herold Levine	[1]
6	David Ruhoff	[1]
7	Kenneth Wacks	[1]

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