Timothy J. Koprowski

	2001
5		Mary P. Kusko, Bryan J. Robbins, Timothy J. Koprowski, William V. Huott: 99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. ITC 2001: 586-592
	1998
4		Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins: Testing the 500-MHz IBM S/390 Microprocessor. IEEE Design & Test of Computers 15(3): 83-89 (1998)
	1997
3		Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko: Testing the 400-MHz IBM Generation-4 CMOS Chip. ITC 1997: 106-114
2		William V. Huott, Timothy J. Koprowski, Bryan J. Robbins, Mary P. Kusko, Stephen Pateras, Dale E. Hoffman, Timothy G. McNamara, Thomas J. Snethen: Advanced microprocessor test strategy and methodology. IBM Journal of Research and Development 41(4&5): 611-628 (1997)
	1990
1		J. Gartner, B. Driscoll, Donato O. Forlenza, Orazio P. Forlenza, Timothy J. Koprowski, T. Lizambri, R. Olsen, S. Robertson, P. Ryan, A. Walter: Weighted random test program generation for a per-pin tester. ITC 1990: 1000-1005

Coauthor Index

1	B. Driscoll	[1]
2	Thomas G. Foote	[3] [4]
3	Donato O. Forlenza	[1]
4	Orazio P. Forlenza	[1]
5	J. Gartner	[1]
6	Dale E. Hoffman	[2] [3] [4]
7	William V. Huott (Bill Huott)	[2] [3] [4] [5]
8	Mary P. Kusko	[2] [3] [4] [5]
9	T. Lizambri	[1]
10	Timothy G. McNamara	[2]
11	R. Olsen	[1]
12	Stephen Pateras	[2]
13	Bryan J. Robbins	[2] [3] [4] [5]
14	S. Robertson	[1]
15	P. Ryan	[1]
16	Thomas J. Snethen	[2]
17	A. Walter	[1]

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