W. Kong

	2001
1		Helmut Puchner, Y.-C. Liu, W. Kong, F. Duan, R. Castagnetti: Substrate Engineering to Improve Soft-Error-Rate Immunity for SRAM Technologies. Microelectronics Reliability 41(9-10): 1319-1324 (2001)

Coauthor Index

1	R. Castagnetti	[1]
2	F. Duan	[1]
3	Y.-C. Liu	[1]
4	Helmut Puchner	[1]

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