J. Komori

	2001
3		A. Teramoto, H. Umeda, K. Azamawari, K. Kobayashi, K. Shiga, J. Komori, Y. Ohno, A. Shigetomi: Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. Microelectronics Reliability 41(1): 47-52 (2001)
2		T. Koyama, M. Umeno, K. Sonoda, J. Komori, Y. Mashiko: Locally delineating of junctions and defects by local cross-section electron-beam-induced-current technique. Microelectronics Reliability 41(8): 1243-1253 (2001)
1		M. K. Mazumder, S. Yamamoto, H. Maeda, J. Komori, Y. Mashiko: Mechanism of pre-annealing effect on electromigration immunity of Al-Cu line. Microelectronics Reliability 41(8): 1259-1264 (2001)

Coauthor Index

1	K. Azamawari	[3]
2	K. Kobayashi	[3]
3	T. Koyama	[2]
4	H. Maeda	[1]
5	Y. Mashiko	[1] [2]
6	M. K. Mazumder	[1]
7	Y. Ohno	[3]
8	K. Shiga	[3]
9	A. Shigetomi	[3]
10	K. Sonoda	[2]
11	A. Teramoto	[3]
12	H. Umeda	[3]
13	M. Umeno	[2]
14	S. Yamamoto	[1]

Colors in the list of coauthors

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