Kiyotaka Komoku

	2009
5		Toshihiro Matsuda, Shinsuke Ishimaru, Shingo Nohara, Hideyuki Iwata, Kiyotaka Komoku, Takayuki Morishita, Takashi Ohzone: Current-Voltage Hysteresis Characteristics in MOS Capacitors with Si-Implanted Oxide. IEICE Transactions 92-C(12): 1523-1530 (2009)
	2008
4		Toshihiro Matsuda, Yuya Sugiyama, Keita Nohara, Kazuhiro Morita, Hideyuki Iwata, Takashi Ohzone, Takayuki Morishita, Kiyotaka Komoku: A Test Structure for Asymmetry and Orientation Dependence Analysis of CMOSFETs. IEICE Transactions 91-C(8): 1331-1337 (2008)
	2007
3		Takashi Ohzone, Eiji Ishii, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Electrical CMOSFET Reliabilities between Center and Edge along the Channel Width. IEICE Transactions 90-C(2): 515-522 (2007)
2		Takashi Ohzone, Tatsuaki Sadamoto, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A CMOS Temperature Sensor Circuit. IEICE Transactions 90-C(4): 895-902 (2007)
	2006
1		Takashi Ohzone, Kazuhiko Okada, Takayuki Morishita, Kiyotaka Komoku, Toshihiro Matsuda, Hideyuki Iwata: A Test Structure to Analyze Highly-Doped-Drain and Lightly-Doped-Drain in CMOSFET. IEICE Transactions 89-C(9): 1351-1357 (2006)

Coauthor Index

1	Eiji Ishii	[3]
2	Shinsuke Ishimaru	[5]
3	Hideyuki Iwata	[1] [2] [3] [4] [5]
4	Toshihiro Matsuda	[1] [2] [3] [4] [5]
5	Takayuki Morishita	[1] [2] [3] [4] [5]
6	Kazuhiro Morita	[4]
7	Keita Nohara	[4]
8	Shingo Nohara	[5]
9	Takashi Ohzone	[1] [2] [3] [4] [5]
10	Kazuhiko Okada	[1]
11	Tatsuaki Sadamoto	[2]
12	Yuya Sugiyama	[4]

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