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| 2011 | ||
|---|---|---|
| 3 | Hafizur Rahaman, Dipak K. Kole, Debesh K. Das, Bhargab B. Bhattacharya: Fault diagnosis in reversible circuits under missing-gate fault model. Computers & Electrical Engineering 37(4): 475-485 (2011) | |
| 2010 | ||
| 2 | Dipak K. Kole, Hafizur Rahaman, Debesh K. Das, Bhargab B. Bhattacharya: Derivation of Optimal Test Set for Detection of Multiple Missing-Gate Faults in Reversible Circuits. Asian Test Symposium 2010: 33-38 | |
| 2008 | ||
| 1 | Hafizur Rahaman, Dipak K. Kole, Debesh Kumar Das, Bhargab B. Bhattacharya: On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set. VLSI Design 2008: 163-168 | |
| 1 | Bhargab B. Bhattacharya | [1] [2] [3] |
| 2 | Debesh Kumar Das (Debesh K. Das) | [1] [2] [3] |
| 3 | Hafizur Rahaman | [1] [2] [3] |
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