B. Kojecký

	2012
4		J. Hájek, V. Papez, B. Kojecký: Investigation of flicker noise in silicon diodes under reverse bias. Microelectronics Reliability 52(3): 469-474 (2012)
	2008
3		V. Papez, B. Kojecký, D. Sámal: Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification. Microelectronics Journal 39(6): 851-856 (2008)
	2006
2		B. Kojecký, V. Papez, D. Sámal: Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. Microelectronics Journal 37(3): 269-274 (2006)
	2003
1		V. Papez, B. Kojecký, J. Kozísek, J. Hejhal: Transient effects on high voltage diode stack under reverse bias. Microelectronics Reliability 43(4): 557-564 (2003)

Coauthor Index

1	J. Hájek	[4]
2	J. Hejhal	[1]
3	J. Kozísek	[1]
4	V. Papez	[1] [2] [3] [4]
5	D. Sámal	[2] [3]

Last update Fri Jun 1 15:44:53 2012 CET by the DBLP Team — Data released under the ODC-BY 1.0 license — See also our legal information page