Masaki Kohno

	2001
2		Yasuo Sato, Masaki Kohno, Toshio Ikeda, Iwao Yamazaki, Masato Hamamoto: An evaluation of defect-oriented test: WELL-controlled low voltage test. ITC 2001: 1059-1067
	1999
1		Shigeru Nakahara, Keiichi Higeta, Masaki Kohno, Toshiaki Kawamura, Keizo Kakitani: Built-in self-test for GHz embedded SRAMs using flexible pattern generator and new repair algorithm. ITC 1999: 301-310

Coauthor Index

1	Masato Hamamoto	[2]
2	Keiichi Higeta	[1]
3	Toshio Ikeda	[2]
4	Keizo Kakitani	[1]
5	Toshiaki Kawamura	[1]
6	Shigeru Nakahara	[1]
7	Yasuo Sato	[2]
8	Iwao Yamazaki	[2]

Colors in the list of coauthors

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