R. W. Knepper

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2009

1 Haitao Dai, R. W. Knepper: Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology. IEEE Trans. on CAD of Integrated Circuits and Systems 28(6): 826-836 (2009)

	2009
1		Haitao Dai, R. W. Knepper: Modeling and Experimental Measurement of Active Substrate-Noise Suppression in Mixed-Signal 0.18µm BiCMOS Technology. IEEE Trans. on CAD of Integrated Circuits and Systems 28(6): 826-836 (2009)

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