Yoshikazu Kiyoshige

	2011
4		Osamu Nishii, Yoichi Yuyama, Masayuki Ito, Yoshikazu Kiyoshige, Yusuke Nitta, Makoto Ishikawa, Tetsuya Yamada, Junichi Miyakoshi, Yasutaka Wada, Keiji Kimura, Hironori Kasahara, Hideo Maejima: A 45-nm 37.3 GOPS/W Heterogeneous Multi-Core SOC with 16/32 Bit Instruction-Set General-Purpose Core. IEICE Transactions 94-C(4): 663-669 (2011)
	2010
3		Yoichi Yuyama, Masayuki Ito, Yoshikazu Kiyoshige, Yusuke Nitta, S. Matsui, Osamu Nishii, Atsushi Hasegawa, Makoto Ishikawa, Tetsuya Yamada, Junichi Miyakoshi, Koichi Terada, Tohru Nojiri, Masashi Satoh, Hiroyuki Mizuno, Kunio Uchiyama, Yasutaka Wada, Keiji Kimura, Hironori Kasahara, Hideo Maejima: A 45nm 37.3GOPS/W heterogeneous multi-core SoC. ISSCC 2010: 100-101
	2002
2		Kazumi Hatayama, Michinobu Nakao, Yoshikazu Kiyoshige, Koichiro Natsume, Yasuo Sato, Takaharu Nagumo: Application of High-Quality Built-In Test to Industrial Designs. ITC 2002: 1003-1012
	2001
1		Michinobu Nakao, Yoshikazu Kiyoshige, Kazumi Hatayama, Yasuo Sato, Takaharu Nagumo: Test Generation for Multiple-Threshold Gate-Delay Fault Model. Asian Test Symposium 2001: 244-

Coauthor Index

1	Atsushi Hasegawa	[3]
2	Kazumi Hatayama	[1] [2]
3	Makoto Ishikawa	[3] [4]
4	Masayuki Ito	[3] [4]
5	Hironori Kasahara	[3] [4]
6	Keiji Kimura	[3] [4]
7	Hideo Maejima	[3] [4]
8	S. Matsui	[3]
9	Junichi Miyakoshi	[3] [4]
10	Hiroyuki Mizuno	[3]
11	Takaharu Nagumo	[1] [2]
12	Michinobu Nakao	[1] [2]
13	Koichiro Natsume	[2]
14	Osamu Nishii	[3] [4]
15	Yusuke Nitta	[3] [4]
16	Tohru Nojiri	[3]
17	Yasuo Sato	[1] [2]
18	Masashi Satoh	[3]
19	Koichi Terada	[3]
20	Kunio Uchiyama	[3]
21	Yasutaka Wada	[3] [4]
22	Tetsuya Yamada	[3] [4]
23	Yoichi Yuyama	[3] [4]

Colors in the list of coauthors

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